Supplier News - July 2012
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Honors for RotoMetrics's Steve Lee
The Label Industry Global Awards 2012 announced that Steve Lee has been awarded the R. Stanton Avery Lifetime Achievement Award. Lee is the vice president of technology at RotoMetrics. The award is sponsored by Avery Dennison.
Lee has been credited for his role in getting the industry to work together to develop and spread the use of pressure-sensitive labels worldwide. He has played an active role in industry associations, especially TLMI, where he has served on the board multiple times and acts as chairman of the TLMI Annual Label Awards Competition. The judges added that his guidance in developing new solutions has maximized the ability of converters to produce world-class products for their end users
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